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TU Dresden » Faculty of Mechanical Science and Engineering » Institute for Materials Science » Chair of Materials Science and Nanotechnology

» presentations   » 2012.03.26




Structure determination beyond crystallinity (CPP 3.6)

C. Elschner, S. Radke, G. Cuniberti, K. Leo, M. Riede

DPG Frühjahrstagung der Sektion Kondensierte Materie (SKM)
DPG Spring Meeting of the Condensed Matter Section (SKM)


2012.03.26; (ER 270) Berlin, Germany

Organic semiconducting materials allow novel optoelectronic devices, combining the excellent optical properties of organic dyes with semiconductor behavior. Organic Light Emitting Diodes and Organic Solar Cells are successful examples in this field. Many organic materials grow strongly disordered or even amorphous in thin films. To distinguish between crystalline or amorphous thin films, X-ray diffraction measurements can be used. If Bragg reflections are missing, organic films are simply classified as amorphous in literature without any specification. We show that it is possible to extract short range order informations even from amorphous organic layers. Using a special grazing incidence X-ray diffraction method [1] it is possible to measure the diffuse scattering of amorphous DBP organic layers. A structural model of the short range order within a few nm gives insight of the molecular stacking in the amorphous layer. The structural model is used as starting configuration for mobility calculations based on Monte Carlo simulations. Finally, the correlation between short range molecule stacking and charge transport is investigated.

[1] C. Elschner et al. Journal of Applied Crystallography 44, 983-990(2011).



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